square surface meaning in Chinese
四方平面
Examples
- The surface morphology and root - mean - square surface roughness of the sio _ 2 films are characterized by scanning electron microscopy ( sem ) and atomic force microscopy ( afm ) . the compositional properties of the sio _ 2 films are analyzed by x - ray photoelectron spectroscopy ( xps ) . the effects of experiment parameters are discussed
对采用不同实验参数沉积得到的硅基sio _ 2光波导薄膜材料,用扫描电子显微镜( sem ) 、原子力显微镜( afm ) 、 x射线光电子能谱( xps )等方法对材料的表面形貌、粗糙度以及化学组成等特征进行了研究。